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Please use this identifier to cite or link to this item: http://hdl.handle.net/123456789/3187

Title: MEASURING UNIVERSAL INTELLIGENCE: TOWARDS ANYTIME INTELLIGENT TESTS
Authors: Geethu Miriam Jacob
Keywords: Measurement of intelligence, Artificial intelligence, Psychometrics, Algorithmic information theory, Kolmogorov complexity, Turing test, Universal intelligence , Computerized adaptive testing, Compression, Inductive inference, Prediction
Issue Date: 26-May-2011
Abstract: The idea of a universal anytime intelligence test is introduced here. The meaning of the terms “universal” and “anytime” is manifold: the test should be able to measure the intelligence of any biological or artificial system that exists at this time or in the future. It should also be able to evaluate both inept and brilliant systems (any intelligence level) as well as very slow to very fast systems (any time scale). Also, the test may be interrupted at any time, producing an approximation to the intelligence score, in such a way that the more time is left for the test, the better the assessment will be. In order to do this, the test proposal is based on previous works on the measurement of machine intelligence based on Kolmogorov complexity and universal distributions, which were developed in the late 1990s (C-tests and compression-enhanced Turing tests). It is also based on the more recent idea of measuring intelligence through dynamic/interactive tests held against a universal distribution of environments. Some of these tests are analysed and their limitations are highlighted so as to construct a test that is both general and practical. Consequently, ideas for a more recent definition of “universal intelligence” in order to design new “universal intelligence tests” are introduced, where a feasible implementation has been a design requirement. One of these tests is the “anytime intelligence test”, which adapts to the examinee’s level of intelligence in order to obtain an intelligence score within a limited time.
URI: http://hdl.handle.net/123456789/3187
Appears in Collections:MTech 2010-2012 Batch

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